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Polarization-driven topological insulator transition in a GaN/InN/GaN quantum well

2012-05-13
M. S. Miao, Q. Yan, C. G. Van de Walle, W. K. Lou, L. L. Li, K. Chang

Abstract

Topological insulator (TI) states have been demonstrated in materials with narrow gap and large spin-orbit interactions (SOI). Here we demonstrate that nanoscale engineering can also give rise to a TI state, even in conventional semiconductors with sizable gap and small SOI. Based on advanced first-principles calculations combined with an effective low-energy k*p Hamiltonian, we show that the intrinsic polarization of materials can be utilized to simultaneously reduce the energy gap and enhance the SOI, driving the system to a TI state. The proposed system consists of ultrathin InN layers embedded into GaN, a layer structure that is experimentally achievable.

Abstract (translated by Google)
URL

https://arxiv.org/abs/1205.2912

PDF

https://arxiv.org/pdf/1205.2912


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