Abstract
Using the high-resolution x-ray diffraction (XRD) analysis, scanning electron microscopy (SEM), and the temperature-dependent microwave resonator characterization, structural properties, phase assemblage and dielectric properties of La(Mg1/2Ti1/2)O3 (LMT) and Nd(Mg1/2Ti1/2)O3 (NMT) ceramics prepared via the mixed oxide route were investigated in this study. Single-phase ceramics were synthesized for both LMT and NMT at sintering temperatures from 1250 degree C to 1675 degree C. On the basis of the XRD analysis we have found that the LMT and NMT compounds have cubic and monoclinic crystal structures, respectively. We have also observed that the relative densities of LMT and NMT vary between about 93 and 99% of the theoretical density, depending on the sintering temperature. Finally, concerning the dielectric properties of the microwave resonators made of LMT and NMT compounds we have measured their temperature coefficient of the resonant frequency ({\tau}f) and the quality factor (Q). It is interesting to notice that ({\tau}f) in the case of the NMT compound (-16 ppm 1/K) is essentially smaller than in the case of the LMT compound (-72 ppm 1/K), therefore proving a better stability against temperature variations in the NMT based resonators. On the other hand, the Q values are very similar, being 34000 at the resonance frequency of 8.07 GHz and 38000 at the resonance frequency of 9.76 GHz in the LMT and NMT cases, respectively. Keywords: dielectric properties; microstructure-final: grain growth; single phase Ln(Mg0.5Ti0.5)O3 (Ln=Nd,La); Lanthanum magnesium titanium oxide.
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URL
https://arxiv.org/abs/1502.07547