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First demonstration of Aluminum gallium nitride - Gallium nitride superlattice based p-channel field effect transistor

2019-02-06
Athith Krishna, Aditya Raj, Nirupam Hatui, Onur Koksaldi, Brian Romanczyk, Chirag Gupta, Stacia Keller, Umesh Mishra

Abstract

To realize the full spectrum of advantages that GaN materials system offers, demonstration of p-GaN based devices is valuable. Authors report the first p-field effect transistor (pFET) based on AlGaN/GaN superlattice (SL) grown using MOCVD. Magnesium was used to dope the material in the superlattice. Lowest sheet resistance of 10 k{\Omega}/sq was achieved for doping of 1.5e+19 cm^-3 of Mg (determined by SIMS). Mobility in the range of 7-10 cm^2/Vs and total sheet charge density in the range of 1e+13- 6e+13 cm^-2 were measured. The device had a maximum drain-source current (IDS) of 3mA/mm and On-Resistance (RON) of 3.48k{\Omega}.mm.

Abstract (translated by Google)
URL

https://arxiv.org/abs/1902.02022

PDF

https://arxiv.org/pdf/1902.02022


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