Abstract
In this letter, we report the operation of AlGaN/GaN HEMTs with Pd gates in air over a wide temperature range from 22∘C to 500∘C. The variation in the threshold voltage (Vth) is less than 1% over the entire temperature range. Moreover, a safe biasing region where the transconductance peak (gm) occurs over the entire temperature range was observed, enabling high-temperature analog circuit design. Furthermore, the operation of the devices over 25 hours was experimentally studied, demonstrating the stability of the DC characteristics and Vth at 400∘C. Finally, the degradation mechanisms of HEMTs at 500∘C over 25 hours of operation are discussed, and are shown to be associated with the 2DEG sheet density and mobility decrease.
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URL
https://arxiv.org/abs/1903.00572